Metrology Wafer Sensors for Leveling, Vibration and Gap Measurements

Wireless, lightweight, wafer-shaped and battery-powered. Available in 200mm and 300mm.

When you need the most efficient and effective measurement devices for semiconductor tool set-up and maintenance processes, count on our wireless Wafer Sensor measurement devices for leveling, vibration and gap measurement. These wafers are vacuum compatible, wireless and provide data in real-time.

Semiconductor fabs and OEMs value the accuracy, precision and versatility of these metrology wafers to enable improvements in fab yields and reduce wafer processing equipment downtime.

  • Leveling Wafer - ALMD
    Measures leveling/tilt in real time

    150 grams and 3.5mm thick, Carbon Fiber

    Available in 200mm and 300mm

  • Vibration Wafer - AVMD
    Measures Vibration in real time in X, Y and Z directions

    150 grams and 3.5mm thick, Carbon Fiber

    Available in 200mm and 300mm

  • Leveling and Vibration Wafer - ALVMD
    Measures Vibration and Leveling in real time

    150 grams and 3.5mm thick, Carbon Fiber

    Data sample rate: 1ms (1000 data points per second)

    Available in 200mm and 300mm

  • Gap Measurement Wafer - AGMD
    Measures Gap or distance in real time between pedestal and shower head in CVD/PVD systems

    3-point Gap measurement in real-time

    Housing material: Anodized Aluminum

    Available in 300mm only

Request a Quote

3 + 4 = ?

©2025 UVFAB Systems, Inc. - All Rights Reserved.
Semiconductor Wafer ID Readers, UV-Ozone Cleaning Systems and Handheld UV Disinfection
ALL PRODUCT, PRODUCT SPECIFICATIONS AND DATA ARE SUBJECT TO CHANGE WITHOUT NOTICE TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN OR OTHERWISE.