Wafer Sensors for Leveling, Vibration and Gap Measurements
Wireless, lightweight, wafer-shaped and battery-powered. Available in 200mm and 300mm.
When you need the most efficient and effective measurement devices for semiconductor tool set-up and maintenance processes, count on our wireless Wafer Sensor measurement devices for leveling, vibration and gap measurement. These wafers are vacuum compatible, wireless and provide data in real-time.
Semiconductor fabs and OEMs value the accuracy, precision and versatility of these metrology wafers to enable improvements in fab yields and reduce wafer processing equipment downtime.
- Leveling Wafer - ALMDMeasures leveling/tilt in real time
150 grams and 3.5mm thick, Carbon Fiber
Available in 200mm and 300mm
- Vibration Wafer - AVMDMeasures Vibration in real time in X, Y and Z directions
150 grams and 3.5mm thick, Carbon Fiber
Available in 200mm and 300mm
- Leveling and Vibration Wafer - ALVMDMeasures Vibration and Leveling in real time
150 grams and 3.5mm thick, Carbon Fiber
Data sample rate: 1ms (1000 data points per second)
Available in 200mm and 300mm
- Gap Measurement Wafer - AGMDMeasures Gap or distance in real time between pedestal and shower head in CVD/PVD systems
3-point Gap measurement in real-time
Housing material: Anodized Aluminum
Available in 300mm only